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Beilstein J. Nanotechnol. 2014, 5, 291–297, doi:10.3762/bjnano.5.32
Figure 1: Schematic representation of the KPFM setup and the MoS2 sample with the RIE SiO2.
Figure 2: (a) Optical microscope image of an exfoliated MoS2 flake on a prepatterned (RIE) SiO2 substrate. A ...
Figure 3: (a) NC-AFM image of MoS2 flake on SiO2 with a gold contact (height = 20 nm). Topography shows areas...
Figure 4: (a) NC-AFM zoom-in of an area consisting of 1L, 2L and FL MoS2. (b) Corresponding KPFM image, calib...
Figure 5: (a) NC-AFM topography of SLM on SiO2 and holes etched in SiO2 using RIE. (b) Work function map corr...